ANÁLISE BIBLIOMÉTRICA DO TECNOSTRESSE BASEADA EM R

Autores

DOI:

https://doi.org/10.18623/rvd.v23.n3.4394

Palavras-chave:

Bibliometric Analysis, R-Based Analysis, Technostress

Resumo

O estudo visa criar um mapa apresentando análises dos principais pesquisadores da área, outros autores que colaboram com esses pesquisadores, revistas com o maior número e qualidade de publicações, as palavras mais utilizadas, a estrutura temática da área, os países líderes e outros países que colaboram com esses países. Dentro desse escopo, um total de 1.297 publicações acadêmicas em inglês na base de dados Web of Science foram analisadas utilizando os pacotes Bibliometrix e Biblioshiny na linguagem de programação R. Riedl, Tarafdar e Maier são pesquisadores líderes na literatura sobre estresse tecnológico. A análise identificou três áreas teóricas principais. Essas áreas são: sistemas de informação e teoria do estresse, modelos de aceitação e adaptação da tecnologia e psicologia organizacional. Tópicos populares que serão importantes para trabalhos futuros na área são o estresse tecnológico positivo (estresse positivo proveniente da tecnologia) e o estresse tecnológico negativo (estresse negativo proveniente da tecnologia). Os Estados Unidos, a China e a Alemanha são os países que mais contribuem para o campo por meio de suas colaborações internacionais. Ao contrário de outros estudos bibliométricos que examinam o estresse tecnológico de forma mais ampla como parte da pesquisa sobre estresse induzido pela tecnologia, este estudo se concentra exclusivamente no conceito de estresse tecnológico e apresenta resultados diferentes para sua estrutura conceitual, o que é a razão mais importante para a singularidade deste estudo.

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Publicado

2026-01-28

Como Citar

Temur, M., Can, E., & Yurtseven, H. R. (2026). ANÁLISE BIBLIOMÉTRICA DO TECNOSTRESSE BASEADA EM R. Veredas Do Direito , 23, e234394. https://doi.org/10.18623/rvd.v23.n3.4394